Constructions of the SbEC-DbED and DbEC codes, and their applications.

Autor:	Feng, G.L., Sihai Xiao, Xiaofa Shi, Rao, T.R.N.
Zdroj:	Proceedings of International Workshop on Defect & Fault Tolerance in VLSI; 1995, p278-286, 9p
Databáze:	Complementary Index
Externí odkaz:	Zobrazit plný text záznamu