GaAs Integrated Circuit Testing Using Electrooptic Sampling.
| Autor: | Weingarten, K.J., Rodwell, M.J.W., Bloom, D.M. |
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| Zdroj: | IEEE/Cornell Conference on Advanced Concepts in High Speed Semiconductor Devices & Circuits, 1987 Proceedings; 1987, p35-44, 10p |
| Databáze: | Complementary Index |
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