Degradation modeling of semiconductor devices and electrical circuits.
| Autor: | Lagies, A.U., Gohler, L., Sigg, J., Turkes, P., Kraus, R. |
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| Zdroj: | ICSE'98 1998 IEEE International Conference on Semiconductor Electronics Proceedings (Cat No98EX187); 1998, p86-90, 5p |
| Databáze: | Complementary Index |
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