Simulation of charge pumping current in hot-carrier degraded p-MOSFET's.
| Autor: | Samudra, G.S., Anselm Yip, See, L.K. |
|---|---|
| Zdroj: | ICSE'98 1998 IEEE International Conference on Semiconductor Electronics Proceedings (Cat No98EX187); 1998, p32-36, 5p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|