Intrinsic gate capacitances of SOI MOSFETs: measurement, modelling, floating substrate effects.
| Autor: | Flandre, D., Van de Wiele, F., Jespers, P.G.A., Haond, M. |
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| Zdroj: | ESSDERC '90: 20th European Solid State Device Research Conference; 1990, p437-440, 4p |
| Databáze: | Complementary Index |
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