Electrical Characterization of a Submicron Titanium Silicide Local Interconnect Technology.
| Autor: | Pitt, M. G., Jonkers, A. G. M., Pomp, H. G., de Werdt, R. |
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| Zdroj: | ESSDERC '89: 19th European Solid State Device Research Conference; 1989, p903-906, 4p |
| Databáze: | Complementary Index |
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