RF annealing of radiation-induced electron traps in MOS structures.
| Autor: | Ma, T.P., Chin, M.R. |
|---|---|
| Zdroj: | 1979 International Electron Devices Meeting; 1979, p224-228, 5p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|
| Autor: | Ma, T.P., Chin, M.R. |
|---|---|
| Zdroj: | 1979 International Electron Devices Meeting; 1979, p224-228, 5p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|