Failure Mechanisms and Reliability of Low-Noise GaAs FETs.
| Autor: | Irvin, J. C., Schlosser, W. O. |
|---|---|
| Zdroj: | 1978 8th European Microwave Conference; 1978, p401-404, 4p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|
| Autor: | Irvin, J. C., Schlosser, W. O. |
|---|---|
| Zdroj: | 1978 8th European Microwave Conference; 1978, p401-404, 4p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|