The Characteristic Wearout Process in Epoxy-Glass Printed Circuits for High Density Electronic Packaging.
| Autor: | Lahti, J. N., Delaney, R. H., Hines, J. N. |
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| Zdroj: | 17th International Reliability Physics Symposium; 1979, p39-43, 5p |
| Databáze: | Complementary Index |
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