A summary of recent VLSI SEU and latch-up testing (for space application).
| Autor: | Kinnison, J.D., Maurer, R.H., McKerracher, P.L., Carkhuff, B.G. |
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| Zdroj: | Workshop Record 1992 IEEE Radiation Effects Data Workshop; 1992, p12-15, 4p |
| Databáze: | Complementary Index |
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