Influence of transistor degradation on CMOS performance and impact on life time criterion.
| Autor: | Winnerl, J., Lill, A., Schmitt-Landsiedel, D., Orlowski, M., Neppl, F. |
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| Zdroj: | Technical Digest, International Electron Devices Meeting; 1988, p204-207, 4p |
| Databáze: | Complementary Index |
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