Contact angle measurement of GaInAsP surfaces for wafer direct bonding with garnet crystals.
| Autor: | Yokoi, H., Mizumoto, T., Shimizu, M., Waniishi, T., Futakuchi, N., Kaida, N., Nakano, Y. |
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| Zdroj: | Technical Digest CLEO/Pacific Rim '99 Pacific Rim Conference on Lasers & Electro-Optics (Cat No99TH8464); 1999, Issue 4, p1206-1206, 1p |
| Databáze: | Complementary Index |
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