Wafer scale integration.

Autor: Driver, M.C., Nathanson, H.C., Freitag, R., Eldridge, G.W., Clarke, R.C., Sopira, M.M.
Zdroj: Proceedings, IEEE/Cornell Conference on Advanced Concepts in High Speed Semiconductor Devices & Circuits; 1989, p1-10, 10p
Databáze: Complementary Index