The influence of the operating mode of IC-devices on their lifetime: a reliability test of plastic encapsulated CMOS-circuits in a humid environment.
| Autor: | Johnsson, P., von Scheele, C. |
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| Zdroj: | Proceedings, 39th Electronic Components Conference; 1989, p335-342, 8p |
| Databáze: | Complementary Index |
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