Laser voltage probe (LVP): a novel optical probing technology for flip-chip packaged microprocessors.
| Autor: | Wai Mun Yee, Paniccia, M., Eiles, T., Rao, V. |
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| Zdroj: | Proceedings of the 1999 7th International Symposium on the Physical & Failure Analysis of Integrated Circuits (Cat No99TH8394); 1999, p15-20, 6p |
| Databáze: | Complementary Index |
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