Analysis of the carrier and temperature distributions in gate turn-off thyristors by internal laser deflection.
| Autor: | Simmnacher, B., Deboy, G., Ruff, M., Schulze, H.-J., Kolbesen, B. |
|---|---|
| Zdroj: | Proceedings of 9th International Symposium on Power Semiconductor Devices & IC's; 1997, p177-180, 4p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|