Processing, transfer solder bumping, chip attachment and testing of a thin film Cu/Photo-BCB MCM-D.

Autor: Ida, Y., Garrou, P.E., Strandjord, A.J.G., Cummings, S.L., Boyd Rogers, W., Berry, M.J., Kisting, S.R.
Zdroj: Proceedings of 1995 Japan International Electronic Manufacturing Technology Symposium; 1995, p441-444, 4p
Databáze: Complementary Index