A vector corrected waveform and load line measurement system for large signal transistor characterisation.
| Autor: | Leckey, J.G., Patterson, A.D., Stewart, J.A.C. |
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| Zdroj: | Proceedings of 1995 IEEE MTT-S International Microwave Symposium; 1995, p1243-1243, 1p |
| Databáze: | Complementary Index |
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