RF-stressed life test of pseudomorphic InGaAs power HEMT MMIC at 44 GHz.

Autor: Chen, C.H., Zell, G., Saito, Y., Yen, H.C., Lai, R., Kin Tan, Loper, J.
Zdroj: Proceedings of 1995 IEEE MTT-S International Microwave Symposium; 1995, p713-713, 1p
Databáze: Complementary Index
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