Real-time predictive control of semiconductor manufacturing processes using neural networks.

Autor: Himmel, C.D., Kim, T.S., Krauss, A., Kamen, E.W., May, G.S.
Zdroj: Proceedings of 1995 American Control Conference - ACC'95; 1995, Issue 2, p1240-1240, 1p
Databáze: Complementary Index