Two-dimensional transient enhanced diffusion and its impact on bipolar transistors.

Autor: van Dort, M.J., van der Wel, W., Slotboom, J.W., Cowern, N.E.B., Knuvers, M.P.G., Lifka, H., Zalm, P.C.
Zdroj: Proceedings of 1994 IEEE International Electron Devices Meeting; 1994, p865-868, 4p
Databáze: Complementary Index