An accurate Monte Carlo binary collision model for BF/sub 2/ implants into (100) single-crystal silicon.

Autor: Yang, S.-H., Morris, S.J., Tian, S., Parab, K., Obradovic, B., Morris, M., Tasch, A.F., Snell, C.M.
Zdroj: Proceedings of 11th International Conference on Ion Implantation Technology; 1996, p547-550, 4p
Databáze: Complementary Index