Novel optical probing technique for flip chip packaged microprocessors.

Autor:	Paniccia, M., Eiles, T., Rao, V.R.M., Wai Mun Yee
Zdroj:	Proceedings International Test Conference 1998 (IEEE Cat No98CH36270); 1998, p740-747, 8p
Databáze:	Complementary Index
Externí odkaz:	Zobrazit plný text záznamu