Identification of faulty processing elements by space-time compression of test responses.
| Autor: | Karpovsky, M.G., Levitin, L.B., Vainstein, F.S. |
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| Zdroj: | Proceedings International Test Conference 1990; 1990, p638-647, 10p |
| Databáze: | Complementary Index |
| Externí odkaz: |
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