Benchmark circuits for analog and mixed-signal testing.
| Autor: | Kondagunturi, R., Bradley, E., Maggard, K., Stroud, C. |
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| Zdroj: | Proceedings IEEE Southeastcon'99 Technology on the Brink of 2000 (Cat No99CH36300); 1999, p217-220, 4p |
| Databáze: | Complementary Index |
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