Yield enhancement considerations for a single-chip multiprocessor system with embedded DRAM.
| Autor: | Rudack, M., Niggemeyer, D. |
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| Zdroj: | Proceedings 1999 IEEE International Symposium on Defect & Fault Tolerance in VLSI Systems (EFT'99); 1999, p31-39, 9p |
| Databáze: | Complementary Index |
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