Non-destructive thickness measurements of GaInAs, AlInAs, and InP multilayer structures.

Autor: Pickering, C., Garawal, N.S., Lancefield, D., Piel, J.P., Blunt, R.T.
Zdroj: Proceedings 1991 Third International Conference Indium Phosphide & Related Materials; 1991, p456-459, 4p
Databáze: Complementary Index