Non-destructive thickness measurements of GaInAs, AlInAs, and InP multilayer structures.
Autor: | Pickering, C., Garawal, N.S., Lancefield, D., Piel, J.P., Blunt, R.T. |
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Zdroj: | Proceedings 1991 Third International Conference Indium Phosphide & Related Materials; 1991, p456-459, 4p |
Databáze: | Complementary Index |
Externí odkaz: |