Experimental results for IDDQ and VLV testing.
| Autor: | Chang, J.T.-Y., Chao-Wen Tseng, Yi-Chin Chu, Wattal, S., Partell, M., McCluskey, E.J. |
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| Zdroj: | Proceedings 16th IEEE VLSI Test Symposium (Cat No98TB100231); 1998, p118-123, 6p |
| Databáze: | Complementary Index |
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