A practical approach to instruction-based test generation for functional modules of VLSI processors.
| Autor: | Hatayama, K., Hikone, K., Miyazaki, T., Yamada, H. |
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| Zdroj: | Proceedings 15th IEEE VLSI Test Symposium (Cat No97TB100125); 1997, p17-22, 6p |
| Databáze: | Complementary Index |
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