Testability metrics for synthesis of self-testable designs and effective test plans.
| Autor: | Vahidi, K., Orailoglu, A. |
|---|---|
| Zdroj: | Proceedings 13th IEEE VLSI Test Symposium; 1995, p170-175, 6p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|
| Autor: | Vahidi, K., Orailoglu, A. |
|---|---|
| Zdroj: | Proceedings 13th IEEE VLSI Test Symposium; 1995, p170-175, 6p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|