Morphological defects in InP layers grown by gas-source molecular beam epitaxy.

Autor: Rakennus, K., Hakkarainen, T., Tappura, K., Asonen, H., Pessa, M.
Zdroj: LEOS 1992 Summer Topical Meeting Digest on Broadband Analog & Digital Optoelectronics, Optical Multiple Access Networks, Integrated Optoelectronics & Smart Pixels; 1992, p171-174, 4p
Databáze: Complementary Index