An investigation of vacancy-related defects in (Pb,La)(Zr,Ti)O/sub 3/ thin films using positron annihilation.
| Autor: | Friessnegg, T., Aggarwal, S., Nielsen, B., Ramesh, R., Keeble, D.J., Poindexter, E.H. |
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| Zdroj: | ISAF 1998 Proceedings of the Eleventh IEEE International Symposium on Applications of Ferroelectrics (Cat No98CH36245); 1998, p147-150, 4p |
| Databáze: | Complementary Index |
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