Performance and hot-carrier reliability of deep-submicrometer CMOS.
| Autor: | Chan, T.Y., Gaw, H. |
|---|---|
| Zdroj: | International Technical Digest on Electron Devices Meeting; 1989, p71-74, 4p |
| Databáze: | Complementary Index |
| Externí odkaz: |
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| Autor: | Chan, T.Y., Gaw, H. |
|---|---|
| Zdroj: | International Technical Digest on Electron Devices Meeting; 1989, p71-74, 4p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|