Flicker noise measurements in enhancement mode and depletion mode n-MOS transistors.
| Autor: | Chang, J., Viswanathan, C.R., Anagnostopoulos, C. |
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| Zdroj: | International Symposium on VLSI Technology, Systems & Applications; 1989, p217-221, 5p |
| Databáze: | Complementary Index |
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