Suppression of reverse short channel effect by high energy implantation.

Autor: Chaudhrya, S., Rafferty, C.S., Nagy, W.J., Chyan, Y.F., Carroll, M.S., Chen, A.S., Lee, K.H.
Zdroj: International Electron Devices Meeting IEDM Technical Digest; 1997, p679-682, 4p
Databáze: Complementary Index