Current signatures for production testing [CMOS ICs].
| Autor: | Gattiker, A., Nigh, P., Grosch, D., Maly, W. |
|---|---|
| Zdroj: | Digest of Papers 1996 IEEE International Workshop on IDDQ Testing; 1996, p25-28, 4p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|
| Autor: | Gattiker, A., Nigh, P., Grosch, D., Maly, W. |
|---|---|
| Zdroj: | Digest of Papers 1996 IEEE International Workshop on IDDQ Testing; 1996, p25-28, 4p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|