Enhanced fault modeling for DRAM test and analysis.
| Autor: | Oberle, H.-D., Maue, M., Muhmenthaler, P. |
|---|---|
| Zdroj: | Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's; 1991, p149-154, 6p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|