CPM-characterization of light and current stressed a-Si:H diodes with nin, pip and pin structures.
| Autor: | Ostendorf, H.-C., Schwarz, R., Kusian, W., Kruhler, W. |
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| Zdroj: | Conference Record of the Twenty Third IEEE Photovoltaic Specialists Conference - 1993 (Cat No93CH3283-9); 1993, p872-877, 6p |
| Databáze: | Complementary Index |
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