A new method for the determination of the minority carrier lifetime based on a biased OCVD technique [solar cells].
Autor: | Bruno, C.J., Martinez Bogado, M.G., Pla, J.C., Duran, J.C. |
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Zdroj: | Conference Record of the Twenty Sixth IEEE Photovoltaic Specialists Conference - 1997; 1997, p191-193, 3p |
Databáze: | Complementary Index |
Externí odkaz: |