A new method for the determination of the minority carrier lifetime based on a biased OCVD technique [solar cells].

Autor: Bruno, C.J., Martinez Bogado, M.G., Pla, J.C., Duran, J.C.
Zdroj: Conference Record of the Twenty Sixth IEEE Photovoltaic Specialists Conference - 1997; 1997, p191-193, 3p
Databáze: Complementary Index