Ray tracing vs. electromagnetic methods in the analysis of antireflective textured surfaces [of solar cells].
| Autor: | Pla, J.C., Duran, J.C., Skigin, D.C., Depine, R.A. |
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| Zdroj: | Conference Record of the Twenty Sixth IEEE Photovoltaic Specialists Conference - 1997; 1997, p187-190, 4p |
| Databáze: | Complementary Index |
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