Real-time monitoring of heteroepitaxial Ga/sub x/In/sub 1-x/P growth on Si(001) by P-Polarised reflectance.
| Autor: | Dietz, N., Sukidi, N., Harris, C., Bachmann, K.J. |
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| Zdroj: | Conference Proceedings 1997 International Conference on Indium Phosphide & Related Materials; 1997, p521-524, 4p |
| Databáze: | Complementary Index |
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