Examination of domain-reversed layers in Z-cut LiNbO/sub 3/ using maker fringe analysis, atomic force microscopy, and high-resolution X-ray diffraction imaging.
| Autor: | Aust, J.A., Steiner, B., Sanford, N.A., Fogarty, G., Yang, B., Roshko, A., Amin, J., Evans, C. |
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| Zdroj: | CLEO '97, Summaries of Papers Presented at the Conference on Lasers & Electro-Optics; 1997, Issue 11, p485-486, 2p |
| Databáze: | Complementary Index |
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