Resistivity, adhesive strength, and residual stress measurements of thin film metallizations on single crystal quartz.
| Autor: | Vianco, P.T., Conley, W.R., Panitz, J.K.G. |
|---|---|
| Zdroj: | 44th Annual Symposium on Frequency Control; 1990, p207-215, 9p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|