Data Retention in SOI-DRAM with Trench Capacitor Cell.
Autor: | Hanafi, H.I., Kanarsky, T., Schmitz, S., Hathorn, K. |
---|---|
Zdroj: | 28th European Solid-State Device Research Conference; 1998, p276-279, 4p |
Databáze: | Complementary Index |
Externí odkaz: |
Autor: | Hanafi, H.I., Kanarsky, T., Schmitz, S., Hathorn, K. |
---|---|
Zdroj: | 28th European Solid-State Device Research Conference; 1998, p276-279, 4p |
Databáze: | Complementary Index |
Externí odkaz: |