Oxide-nitride-oxide antifuse reliability.
Autor: | Chiang, S., Wang, R., Chen, J., Hayes, K., McCollum, J., Hamdy, E., Hu, C. |
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Zdroj: | 28th Annual Proceedings on Reliability Physics Symposium; 1990, p186-192, 7p |
Databáze: | Complementary Index |
Externí odkaz: |