Reliability study of thin inter-poly dielectrics for non-volatile memory application.
| Autor: | Mori, S., Kaneko, Y., Arai, N., Ohshima, Y., Araki, H., Narita, K., Sakagami, E., Yoshikawa, K. |
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| Zdroj: | 28th Annual Proceedings on Reliability Physics Symposium; 1990, p132-144, 13p |
| Databáze: | Complementary Index |
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