A new bond failure wire crater in surface mount device.
Autor: | Koyama, H., Shiozaki, H., Okumura, I., Mizugashira, S., Higuchi, H., Ajiki, T. |
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Zdroj: | 26th Annual Proceedings Reliability Physics Symposium 1988; 1988, p59-63, 5p |
Databáze: | Complementary Index |
Externí odkaz: |