A new bond failure wire crater in surface mount device.

Autor: Koyama, H., Shiozaki, H., Okumura, I., Mizugashira, S., Higuchi, H., Ajiki, T.
Zdroj: 26th Annual Proceedings Reliability Physics Symposium 1988; 1988, p59-63, 5p
Databáze: Complementary Index