Input ESD Protection Networks for Fineline NMOS - Effects of Stressing Waveform and Circuit Layout.
| Autor: | DeChiaro, Louis F., Vaidya, Sheila, Chemelli, Robert G. |
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| Zdroj: | 24th International Reliability Physics Symposium; 1986, p206-214, 9p |
| Databáze: | Complementary Index |
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