Latent B-Radiation Damage in Hermetically Sealed NMOS Devices.
| Autor: | Boyle, J. L., McIntyre, R. C., Youtz, R. E., Nelson, J. T. |
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| Zdroj: | 19th International Reliability Physics Symposium; 1981, p34-37, 4p |
| Databáze: | Complementary Index |
| Externí odkaz: |
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| Autor: | Boyle, J. L., McIntyre, R. C., Youtz, R. E., Nelson, J. T. |
|---|---|
| Zdroj: | 19th International Reliability Physics Symposium; 1981, p34-37, 4p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|