Degradation of single-quantum well InGaN green light emitting diodes under high electrical stress.
| Autor: | Barton, D.L., Osinski, M., Perlin, P., Eliseev, P.G., Lee, J. |
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| Zdroj: | 1998 IEEE International Reliability Physics Symposium Proceedings 36th Annual (Cat No98CH36173); 1998, p119-123, 5p |
| Databáze: | Complementary Index |
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